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A. Gholami, T.h. Shah , M. Mazandarani ,
Volume 18, Issue 2 (4-2007)

Abstract: The big share of electrical breakdown in electrical devices failure among other factors is caused by multitasking such as electrical insulation, mechanical support, energy dissipation, Energy storage, etc. which brings many attentions to lifetime estimation of said insulation material. Up to now, there was no-general theory had been suggested for lifetime estimation of mentioned insulation material the main reason of that was the lack of knowledge on interfering mechanisms. This paper is devoted to suggest a new state-of-art lifetime estimation method with the interest to reduce test procedure time consumption. At first briefly, suggested method has been surveyed to bold its advantages and drawbacks. The lifetime of insulating material estimated from our method, which has been named as HAMD, was better than estimated from the other tests and found to show good agreement with the experimental results.


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